Particle sizer calibration, validation
Applied Microspheres offers nano and microstandards with a range of nominal diameters for calibrating and validating many types of particle sizing instruments based on various principles.
Particle sizing instruments include;
- Microscopy
-Optical, Scanning electron, Transmission electron, Atomic force and Imaging analysis
- Light interaction
-Laser diffraction, Spatially Resolved and conventional Dynamic light scattering, Single particle light obscuration and Multi angle light scattering
- Electrical property sizing
-Electrical sensing zone, Differential mobility analyszer, Electrophoretic mobility and Zeta potential
- Sedimentation
-Centrifugal sedimentation and Photosedimentation
- Sorting
-Flow cytometry, Filed flow fractionating and Sieving
