Particle sizer calibration, validation

Applied Microspheres offers nano and microstandards with a range of nominal diameters for calibrating and validating many types of particle sizing instruments based on various principles.

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Particle sizing instruments include;


  • Microscopy
    -Optical, Scanning electron, Transmission electron, Atomic force and Imaging analysis
    • Light interaction
      -Laser diffraction, Spatially Resolved and conventional Dynamic light scattering, Single particle light obscuration and Multi angle light scattering
      • Electrical property sizing
        -Electrical sensing zone, Differential mobility analyszer, Electrophoretic mobility and Zeta potential
        • Sedimentation
          -Centrifugal sedimentation and Photosedimentation
          • Sorting
            -Flow cytometry, Filed flow fractionating and Sieving